Contacts

Here are some examples of the analysis measured at CEITEC Nano facility:

3D material structural analysis with high mass, spatial and depth resolution. Resolving of Al grains, Si precipitates in grains, grain boundaries, and Si/Al interface. 3D precipitates size evaluation.

Oxygen map obtained by the Nano-SIMS analysis showing a larger amount of oxygen in hexaboron nitride. More info can be found in this article.

Structure analysis of side part of TIGBT transistor

SIMS analysis of the airborne pollution particle on a silicon substrate next to a golden marker. The aim of the analysis was to find out the composition of the circle layer (a residuum of the liquid originally attached to the particle).

Structure analysis of HSQ resist

Petr Bábor

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E-mail: petr.babor@ceitec.vutbr.cz
Phone: +420 604 758 891
Office: C2.21
Address: Purkyňova 123, Brno, 612 00